Defect Diagnosis of Digital Circuits Using Surrogate Faults
نویسندگان
چکیده
Classical single stuck-at faults are analyzed as surrogates for any non-classical fault that may have caused an observed failure. Although multiple stuck-at faults are used as an illustrative example of non-classical faults, proposed algorithms are applicable to any other type of fault. Our effect-cause analysis is less complex than existing methods. The diagnostic procedure adds or removes faults from a set of candidate faults based on the observed circuit outputs, using minimal fault simulation, to obtain a small set of suspected faults.
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